Atomic Force Microscopy
Storrs
Institute of Materials Science
Contacts
General Contact
imsinfo@uconn.eduBryan Huey, Ph.D.
bryan.huey@uconn.eduCampus Address
Institute of Materials Science
Science 1
Storrs Campus
Mailing Address
25 King Hill Road, Unit 3136
Storrs, CT 06269-3136
Resources
Asylum Research Cypher ES/VRS
The AFM user facility residing within IMS excels at multiple advanced characterization methods. Lab personnel have substantial expertise with a wide range of novice to expert AFM techniques that utilize creative methods to achieve imaging needs.
Accessories include VR high speed scanner, dual gain ORCA for CAFM, high V module for TDDB, and all hardware and software for nanolithography, contact and AC mode (‘Tapping’) imaging, and contrast mechanisms spanning phase, CAFM, pcAFM, EFM, MFM, SSPM/KPFM, PFM, AFAM, FFM, and F-d measurements and mapping.
Asylum Research Cypher S
The AFM user facility residing within IMS excels at multiple advanced characterization methods. Lab personnel have substantial expertise with a wide range of novice to expert AFM techniques that utilize creative methods to achieve imaging needs.
Accessories include dual gain ORCA for CAFM, in situ oblique laser illumination for PC-AFM, gas lines for N2 or Ar overpressure, and all hardware and software for nanolithography, contact and AC mode (‘Tapping’) imaging, and contrast mechanisms spanning phase, CAFM, pcAFM, EFM, MFM, SSPM/KPFM, PFM, AFAM, FFM, and F-d measurements and mapping.
Asylum Research mfp-3D-SA
The AFM user facility residing within IMS excels at multiple advanced characterization methods. Lab personnel have substantial expertise with a wide range of novice to expert AFM techniques that utilize creative methods to achieve imaging needs.
Accessories include POLY-heater for variable temperature AFM (RT up to 300C), humidity control via salt solutions, and all hardware and software for nanolithography, contact and AC mode (‘Tapping’) imaging, and contrast mechanisms spanning phase, CAFM, pcAFM, EFM, MFM, SSPM/KPFM, PFM, AFAM, FFM, and F-d measurements and mapping.
Asylum Research mfp-3D-BIO
The AFM user facility residing within IMS excels at multiple advanced characterization methods. Lab personnel have substantial expertise with a wide range of novice to expert AFM techniques that utilize creative methods to achieve imaging needs.
Accessories include liquid cell with RT up to 40C temperature control, POLY heater for variable temperature AFM (RT up to 300C), humidity control via salt solutions, and all hardware and software for nanolithography, contact and AC mode (‘Tapping’) imaging, and contrast mechanisms spanning phase, CAFM, pcAFM, EFM, MFM, SSPM/KPFM, PFM, AFAM, FFM, and F-d measurements and mapping.
